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Effects of Higher-Order Laue Zone Reflections on Atomic Resolution TEM Images of Single Layer and Bilayer Graphene

Published online by Cambridge University Press:  01 August 2010

HS Kim
HS Kim
Affiliation:
Kyungsung University, Korea

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Type
Abstract
Information
Microscopy and Microanalysis , Volume 16 , Supplement S2 , July 2010 , pp. 274 - 275
Copyright
Copyright © Microscopy Society of America 2010