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Effect of Correction of the 3-Fold Astigmatism on HREM Lattice Imaging With Information Below 100 Pm

Published online by Cambridge University Press:  02 July 2020

Y.C. Wang ,
A. Fitzgerald ,
E.C. Nelson ,
C. Song ,
M.A. O’Keefe  and
C. Kisielowski
Y.C. Wang
Affiliation:
FEI and Philips
A. Fitzgerald
Affiliation:
University of Dundee /UK
E.C. Nelson
Affiliation:
National Center for Electron Microscopy, Berkeley, CA94720/, USA
C. Song
Affiliation:
National Center for Electron Microscopy, Berkeley, CA94720/, USA
M.A. O’Keefe
Affiliation:
National Center for Electron Microscopy, Berkeley, CA94720/, USA
C. Kisielowski
Affiliation:
National Center for Electron Microscopy, Berkeley, CA94720/, USA
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Extract

High resolution electron microscopes with field emission sources opened the possibility to investigate solids on a 100 pm range. Either electron holograpy can be applied or an information limit that may even extend into a region below 100 pm can be exploited to reach this goal [1]. However, lens aberrations such as the three-fold astigmatism often complicate an image interpretation in the 100 pm range or even make it impossible [2]. On the other hand, there is growing need to understand physical processes at a mono-atomic level in order to further develop artificially structured materials such as nano-crystals, ceramic coatings or semiconductors. Commonly, such materials contain light elements like C, N, or O with bond lengths that are shorter than a typical 180 pm point resolution of a high resolution, electron microscope. The carbon-carbon distance of 150 pm is the shortest bond length value in crystalline solids. Moreover, any projection of a diamond lattice along a low index zone axis for lattice imaging leads to a reduced C-C distance.

Type
Future of Microscopy: Ceramics, Composites, and Cement
Information
Microscopy and Microanalysis , Volume 5 , Issue S2: Proceedings: Microscopy & Microanalysis '99, Microscopy Society of America 57th Annual Meeting, Microbeam Analysis Society 33rd Annual Meeting, Portland, Oregon August 1-5, 1999 , August 1999 , pp. 822 - 823
Copyright
Copyright © Microscopy Society of America

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References

[1] Voelkl, E., Lichte, H., Ultramicroscopy 32, 177, 1990CrossRefGoogle Scholar

[2] e.g Hawkes, P.W and Kasper, E., “Electron Optics”, Academic Press, London 1989, p. 297 ff.Google Scholar

[3] Wang, Y.C., O’Keefe, M.A., Pan, M., Nelson, E.C., and Kisielowski, C., Electron Microscopy 1998, Calderon Benavides, H.A., Yacaman, M.J. (eds), Inst. Of Phys. Publishing, Bristol 1998, p. 57Google ScholarPubMed

[4] Bleeker, A., Overwijk, H.H.F., and Otten, M.T., Microscopy and Microanalyses 1996, 418CrossRefGoogle Scholar

[5] Diffractograms in figure 2 are a courtesy of Dr.Pan, M., Gatan, Google Scholar