Hostname: page-component-5c6d5d7d68-thh2z Total loading time: 0 Render date: 2024-08-18T04:23:50.422Z Has data issue: false hasContentIssue false

EELS Characterization of Silicon Oxycarbide Glasses

Published online by Cambridge University Press:  02 July 2020

S.C. Cheng
Affiliation:
Materials Characterization Laboratory, The Pennsylvania State University, University Park, PA16802, USA
P. Colombo
Affiliation:
Dipartimento di Chimica Applicata e Scienza dei Materiali Universita’ di Bologna.40136, Bologna, Italy
C.G. Pantano
Affiliation:
Materials Characterization Laboratory, The Pennsylvania State University, University Park, PA16802, USA
Get access

Extract

Anionic modification of silicate-based glasses with carbon has recently attracted the attention of many research groups due to the beneficial effect on mechanical properties and both thermal and chemical stability. These carbon containing glasses, termed silicon oxycarbide glasses, can be synthesized from various organically modified silica gels or from preceramic polymers after a pyrolysis process in an inert atmosphere. The oxycarbide network is often mixed with a free carbon phase, and so the local environment around C atoms exhibits a complex distribution . In the ideal silicon oxycarbide phase, carbon atoms would be present only in carbidic units (forming only Si-C bonds). The carbon phases and the chemical bonding in the silicon oxycarbide have been investigated by high resolution electron microscopy (HREM), Raman spectroscopy, X-ray photoelectron spectroscopy (XPS) and electron paramagnetic resonance (EPR). Electron Energy Loss Spectroscopy (EELS) is an important analytical technique that can be used to further characterize the local chemistry and electronic structure of these glasses.

Type
Compositional Imaging and Spectroscopy
Copyright
Copyright © Microscopy Society of America

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1.Pantano, C.G.et al., to be published in J. Sol-Gel. Sci. Tech., 1999.Google Scholar
2.Renlund, G.M.et al., Journal Materials Research, 12(1991)2723.CrossRefGoogle Scholar
3.Onneby, C. and Pantano, C.G., J. Vac. Sci. Tech., A 15(1997)1597.CrossRefGoogle Scholar
4.Hahn, B., Weissmann, R. and Greil, P., J. Mat. Sci. Letters, 18(1996)1243.CrossRefGoogle Scholar
5.Brydson, R.et al., in Disko, M.M., Ahn, C.C. and Fultz, B., Ed., Transmission Electron Energy- Loss Spectrometry in Materials Science, TMS (1992)131.Google Scholar