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EBSD of Rough Native CuInGaSe2 Thin-Films

Published online by Cambridge University Press:  30 July 2021

Marzieh Baan ,
Ari N. Blumer  and
Tyler J. Grassman
Marzieh Baan
Affiliation:
Dept. of Materials Science & Engineering, The Ohio State University, Columbus, OH, 43210, USA, Columbus, Ohio, United States
Ari N. Blumer
Affiliation:
Dept. of Materials Science & Engineering, The Ohio State University, Columbus, OH, 43210, USA, Ohio, United States
Tyler J. Grassman
Affiliation:
Dept. of Materials Science & Engineering, The Ohio State University, Columbus, OH, 43210, USA, Ohio, United States

Abstract

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Type
Microscopy & Spectroscopy of Energy Conversion and Storage Materials
Information
Microscopy and Microanalysis , Volume 27 , Supplement S1 , August 2021 , pp. 3442 - 3444
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Copyright
Copyright © The Author(s), 2021. Published by Cambridge University Press on behalf of the Microscopy Society of America

References

Paul, P. K., Cardwell, D. W., Jackson, C. M., IEEE Journal of Photovoltaics, 5, (2015), p. 1482 - 1486CrossRefGoogle Scholar
Deitz, J. I., Paul, P. K., Farshchi, R., Advanced Energy Materials, 9, (2019), p. 1901612CrossRefGoogle Scholar
Raghuwanshi, M., Wuerz, R., and Cojocaru-Mirédin, O., Advanced Functional Materials, 30, (2020), p. 2001046Google Scholar
Raghuwansh, M., Cadel, E., Duguay, S.n, Progress in Photovoltaics. 25, (2017), p. 367–375CrossRefGoogle Scholar
Rozeveld, S., Reinhardt, C., Bykov, E., Microscopy Today, 26, (2018), pp. 32 – 39Google Scholar
Jackson, M. A., Pascal, E., De Graef, M., Integrating Materials and Manufacturing Innovation, 8, (2019), p. 226–246CrossRefGoogle Scholar
Lenthea, W.C., Singhb, S., De Graef, M., Ultramicroscopy, 207, (2019) p.112841Google Scholar
Singh, S., Ram, F., De Graef, M., Microscopy and Microanalysis, 23, (2017), p. 212 - 213Google Scholar