Hostname: page-component-848d4c4894-tn8tq Total loading time: 0 Render date: 2024-06-21T07:53:22.032Z Has data issue: false hasContentIssue false
  • English
  • Français

Dislocation imaging via the virtual dark-field technique using the precession electron diffraction data

Published online by Cambridge University Press:  30 July 2021

Dexin Zhao  and
Kelvin Xie
Dexin Zhao
Affiliation:
Texas A & M University, United States
Kelvin Xie
Affiliation:
Texas A & M University, United States

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Defects in Materials: How We See and Understand Them
Information
Microscopy and Microanalysis , Volume 27 , Supplement S1 , August 2021 , pp. 2916 - 2917
Check for updates
Copyright
Copyright © The Author(s), 2021. Published by Cambridge University Press on behalf of the Microscopy Society of America

References

Hull, D., Bacon, D.J., Introduction to Dislocations, 5. ed, Elsevier/Butterworth-Heinemann, Amsterdam, 2011.Google Scholar
Williams, D.B., Carter, C.B., Transmission Electron Microscopy, Springer US, Boston, MA, 1996, pp. 3–17.CrossRefGoogle Scholar
Cockayne, D.J.H., Ray, I.L.F., Whelan, M.J., Philosophical Magazine 20 (1969) 1265–1270.Google Scholar
Rauch, E.F., Véron, M., Eur. Phys. J. Appl. Phys. 66 (2014) 10701.CrossRefGoogle Scholar
Rauch, E.F., Véron, M., Microsc Microanal 20 (2014) 1456–1457.CrossRefGoogle Scholar
Rottmann, P.F., Hemker, K.J., Materials Research Letters 6 (2018) 249–254.Google Scholar
Zhao, D., Xie, K.Y., Microsc Microanal (2020) 1–2.Google Scholar
Zhao, D., Ma, X., Srivastava, A., Turner, G., Karaman, I., Xie, K.Y., Acta Materialia (2021) 116691.Google Scholar