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Direct Insights on Flax Fiber Structure by Focused Ion Beam Microscopy

Published online by Cambridge University Press:  26 January 2010

Bernadette Domenges  and
Karine Charlet
Bernadette Domenges*
Affiliation:
LAMIPS, Joint Laboratory NXP-CRISMAT, CNRS-UMR6508, ENSICAEN, UCBN, 2 rue de la Girafe, BP5120, 14079 Caen Cedex, France
Karine Charlet
Affiliation:
CRISMAT Laboratory, CNRS-UMR 6508, ENSICAEN, 6 Boulevard du Maréchal Juin, 14050 Caen Cedex, France
*
Corresponding author. E-mail: bernadette.domenges@nxp.com
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Abstract

In this article, it is shown that focused ion beam (FIB) systems can be used to study the inner structure of flax fibers, the use of which as a reinforcing material in polymer composites still draws much interest from multiple disciplines. This technique requires none of the specific preparations necessary for scanning electron microscopy or transmission electron microscopy studies. Irradiation experiments performed on FIB prepared cross sections with very low Ga+ ion beam currents revealed the softer material components of fibers. Thus, it confirmed the presence of pectin-rich layers at the interfaces between the fibers of a bundle, but also allowed the precise localization of such layers within the secondary cell wall. Furthermore, it suggested new insights on the transition modes between the sublayers of the secondary cell wall.

Keywords

focused ion beam microscopyflaxmicrostructurecellulosecell wall
Type
Biological Applications
Information
Microscopy and Microanalysis , Volume 16 , Issue 2 , April 2010 , pp. 175 - 182
Copyright
Copyright © Microscopy Society of America 2010

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References

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