Hostname: page-component-7bb8b95d7b-2h6rp Total loading time: 0 Render date: 2024-09-11T18:15:23.498Z Has data issue: false hasContentIssue false
  • English
  • Français

Direct Imaging of Point Defects in a Quasicrystal by Cs-Corrected Ultrahigh-Resolution 300kV-STEM

Published online by Cambridge University Press:  01 August 2005

E Abe  and
S J Pennycook
E Abe
Affiliation:
National Institute for Materials Science, Japan
S J Pennycook
Affiliation:
Oak Ridge National Laboratory, Oak Ridge, Tennessee

Extract

Core share and HTML view are not available for this content. However, as you have access to this content, a full PDF is available via the ‘Save PDF’ action button.

Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

Type
Research Article
Information
Microscopy and Microanalysis , Volume 11 , Issue S02 , August 2005 , pp. 550 - 551
Copyright
© 2005 Microscopy Society of America