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Direct atomistic defect observations by depth sectioning and dynamic STEM

Published online by Cambridge University Press:  30 July 2021

Ryo Ishikawa ,
Naoya Shibata  and
Yuichi Ikuhara
Ryo Ishikawa
Affiliation:
Institute of Engineering Innovation, University of Tokyo, Tokyo, Japan
Naoya Shibata
Affiliation:
Institute of Engineering Innovation, University of Tokyo, United States
Yuichi Ikuhara
Affiliation:
Institute of Engineering Innovation, University of Tokyo, Tokyo, Japan

Abstract

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Type
Defects in Materials: How We See and Understand Them
Information
Microscopy and Microanalysis , Volume 27 , Supplement S1 , August 2021 , pp. 2138 - 2139
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Copyright
Copyright © The Author(s), 2021. Published by Cambridge University Press on behalf of the Microscopy Society of America

References

Morishita, S. et al. , Microscopy 67 46 (2018).Google Scholar
Ishikawa, R. et al. , Phys. Rev. Appl. 13 034064 (2020).CrossRefGoogle Scholar
Ishikawa, R. et al. , Microscopy 69 240 (2020).CrossRefGoogle Scholar
Ishikawa, R. et al. , Ultramicroscopy 222 133215 (2021).Google Scholar
This work was partly supported by NEDO-RISING2 project (JPNP16001).Google Scholar