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Diffraction Mapping with a Pixelated Detector to Quantify Crystal Orientation in 3D Structures Made from 2D Materials
Published online by Cambridge University Press: 05 August 2019
Abstract
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- Type
- Electron Crystallography of Nano-structures in Nanotechnology, Materials and Bio-Sciences
- Information
- Copyright
- Copyright © Microscopy Society of America 2019
References
[4]Funding from the DOD/AFOSR 2D MURI project (FA9550-16-1-0031) and facilities support from the Cornell Center for Materials Research, an NSF MRSEC (DMR-1719875).Google Scholar