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Diffraction contrast analysis of dislocations in 2D materials using true dark-field and 4D-STEM in SEM
Published online by Cambridge University Press: 30 July 2021
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- Advances in Analytical STEM-in-SEM
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- Copyright
- Copyright © The Author(s), 2021. Published by Cambridge University Press on behalf of the Microscopy Society of America
References
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We gratefully acknowledge financial support by the German Research Foundation (DFG) within the frameworks of the research training group GRK1896 “In situ Microscopy with Electrons, X-rays and Scanning Probes” and the Collaborative Research Centre 953 “Synthetic C-allotropes”.Google Scholar
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