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Differential Phase Contrast Scanning Transmission Electron Microscopy at Atomic Resolution

Published online by Cambridge University Press:  05 August 2019

N. Shibata
N. Shibata*
Affiliation:
starInstitute of Engineering Innovation, The University of Tokyo, Tokyo 113-8656Japan Nanostructures Research Laboratory, Japan Fine Ceramic Center, Nagoya 456-8587, Japan
*
*Corresponding author: shibata@sigma.t.u-tokyo.ac.jp

Abstract

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Type
Advances in Phase Retrieval Microscopy
Information
Microscopy and Microanalysis , Volume 25 , Supplement S2 , August 2019 , pp. 14 - 15
Copyright
Copyright © Microscopy Society of America 2019 

References

[1]Dekkers, N.H. and de Lang, H., Optik, 41, 452 (1974).Google Scholar
[2]Shibata, N. et al. , Acc. Chem. Res., 50, 1502-1512 (2017).Google Scholar
[3]Shibata, N. et al. , J. Electron Microscopy, 59, 473-479 (2010).Google Scholar
[4]Shibata, N. et al. , Nature Phys., 8, 611-615 (2012).Google Scholar
[5]Shibata, N. et al. , Nature Comm. 8, 15631 (2017).Google Scholar
[6]Seki, T. et al. , Ultramicroscopy, 182, 258-263 (2017).Google Scholar
[7]Sánchez-Santolino, G. et al. , ACS Nano, 12, 8875 (2018).Google Scholar
[8]The author thank all the collaborators of this research, especially Drs. S.D. Findlay, Y. Kohno, T. Seki, R. Ishikawa, G. Sánchez-Santolino and Y. Ikuhara for their contribution to the works shown in this presentation. The author acknowledges support from the SENTAN, JST and the JSPS KAKENHI Grant number JP17H01316.Google Scholar