Hostname: page-component-76fb5796d-22dnz Total loading time: 0 Render date: 2024-04-26T06:48:13.608Z Has data issue: false hasContentIssue false
  • English
  • Français

Developments in EBSD Pattern Background Removal, Band Detection and Indexing for Improved Data Quality and Ease of Use

Published online by Cambridge University Press:  23 November 2012

J. Goulden ,
N.H. Schmidt ,
H.U. Singh  and
S.D. Sitzman
J. Goulden
Affiliation:
Oxford Instruments NanoAnalysis, High Wycombe, Bucks, United Kingdom
N.H. Schmidt
Affiliation:
Oxford Instruments NanoAnalysis, High Wycombe, Bucks, United Kingdom
H.U. Singh
Affiliation:
Oxford Instruments NanoAnalysis, High Wycombe, Bucks, United Kingdom
S.D. Sitzman
Affiliation:
Oxford Instruments Inc, Concord, MA
Get access

Abstract

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Type
Research Article
Information
Microscopy and Microanalysis , Volume 18 , Issue S2: Proceedings of Microscopy & Microanalysis 2012 , July 2012 , pp. 1254 - 1255
Copyright
Copyright © Microscopy Society of America 2012

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)