Hostname: page-component-76fb5796d-skm99 Total loading time: 0 Render date: 2024-04-25T21:19:31.728Z Has data issue: false hasContentIssue false
  • English
  • Français

Development of Cryo-STEM for Scanning Electron Microscopy

Published online by Cambridge University Press:  31 July 2006

H Dobberstein ,
H Duan ,
JN Skepper  and
M Hayles
H Dobberstein
Affiliation:
University of Cambridge
H Duan
Affiliation:
University of Cambridge
JN Skepper
Affiliation:
University of Cambridge
M Hayles
Affiliation:
FEI Company

Extract

Core share and HTML view are not available for this content. However, as you have access to this content, a full PDF is available via the ‘Save PDF’ action button.

Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

Type
Abstract
Information
Microscopy and Microanalysis , Volume 12 , Issue S02 , August 2006 , pp. 1116 - 1117
Copyright
© 2006 Microscopy Society of America