Hostname: page-component-8448b6f56d-xtgtn Total loading time: 0 Render date: 2024-04-24T11:57:05.892Z Has data issue: false hasContentIssue false
  • English
  • Français

Development of an X-ray Based Spectroscopy MicroXRF System with LA-ICP-MS Capabilities: Trace-Level Microns-scale Mapping and Femtogram Detection Sensitivity

Published online by Cambridge University Press:  04 August 2017

SH Lau ,
Sylvia JY Lewis ,
Wenbing Yun ,
Benjamin Stripe ,
Janos Kirz ,
Alan Lyon ,
David Reynolds  and
Richard Ian Spink
SH Lau
Affiliation:
Sigray, Inc. Concord, CAUSA
Sylvia JY Lewis
Affiliation:
Sigray, Inc. Concord, CAUSA
Wenbing Yun
Affiliation:
Sigray, Inc. Concord, CAUSA
Benjamin Stripe
Affiliation:
Sigray, Inc. Concord, CAUSA
Janos Kirz
Affiliation:
Sigray, Inc. Concord, CAUSA
Alan Lyon
Affiliation:
Sigray, Inc. Concord, CAUSA
David Reynolds
Affiliation:
Sigray, Inc. Concord, CAUSA
Richard Ian Spink
Affiliation:
Sigray, Inc. Concord, CAUSA

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Information
Microscopy and Microanalysis , Volume 23 , Supplement S1: Proceedings of Microscopy & Microanalysis 2017 , July 2017 , pp. 44 - 45
Copyright
© Microscopy Society of America 2017 

References

■

[1] Butler, , et al, Journal of Analytical Atomic Spectrometry 2016.Google Scholar
[2] Limbeck, , et al, Analytical andBioanalytical Chemistry 2015.Google Scholar
[3] The authors acknowledge funding from the NSF, Division of Industrial Innovation & Partnerships for the development of x-ray mirror lens (IIP-1448727) and the NIH, National Institute of General Medicine Science for the development of the microstructured source target (GRANT11545218).Google Scholar