Hostname: page-component-76fb5796d-5g6vh Total loading time: 0 Render date: 2024-04-25T17:02:02.260Z Has data issue: false hasContentIssue false
  • English
  • Français

Developing an Atomic Scale Model of Tilt Grain Boundary Potentials in Perovskite Oxides Using Z-contrast Imaging and EELS

Published online by Cambridge University Press:  01 August 2004

Robert F. Klie ,
Marco Beleggia ,
Yimei Zhu ,
James P. Buban  and
Nigel D. Browning
Robert F. Klie
Affiliation:
Brookhaven National Laboratory, Upton
Marco Beleggia
Affiliation:
Brookhaven National Laboratory, Upton
Yimei Zhu
Affiliation:
Brookhaven National Laboratory, Upton
James P. Buban
Affiliation:
University of Tokyo, Japan
Nigel D. Browning
Affiliation:
University of California, Davis
Get access

Extract

Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Type
Research Article
Information
Microscopy and Microanalysis , Volume 10 , Issue S02 , August 2004 , pp. 268 - 269
Copyright
© 2004 Microscopy Society of America

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)