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Determining Optical Absorption Coefficients in Beam Sensitive Materials using Monochromated Electron Energy-Loss Spectroscopy

Published online by Cambridge University Press:  04 August 2017

Jessica A. Alexander ,
Frank J. Scheltens ,
Lawrence F. Drummy ,
Michael F. Durstock ,
Fredrik S. Hage ,
Quentin M. Ramasse  and
David W. McComb
Jessica A. Alexander
Affiliation:
Center for Electron Microscopy and Analysis, Department of Materials Science and Engineering, The Ohio State University, 1305 Kinnear Road, Columbus OH 43212, United States
Frank J. Scheltens
Affiliation:
Center for Electron Microscopy and Analysis, Department of Materials Science and Engineering, The Ohio State University, 1305 Kinnear Road, Columbus OH 43212, United States
Lawrence F. Drummy
Affiliation:
Materials and Manufacturing Directorate, Air Force Research Laboratory, Wright-Patterson Air Force Base, WPAFB, OH, United States
Michael F. Durstock
Affiliation:
Materials and Manufacturing Directorate, Air Force Research Laboratory, Wright-Patterson Air Force Base, WPAFB, OH, United States
Fredrik S. Hage
Affiliation:
SuperSTEM Laboratory, SciTech Daresbury Campus, Daresbury, United Kingdom
Quentin M. Ramasse
Affiliation:
SuperSTEM Laboratory, SciTech Daresbury Campus, Daresbury, United Kingdom
David W. McComb
Affiliation:
Center for Electron Microscopy and Analysis, Department of Materials Science and Engineering, The Ohio State University, 1305 Kinnear Road, Columbus OH 43212, United States

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 23 , Supplement S1: Proceedings of Microscopy & Microanalysis 2017 , July 2017 , pp. 1810 - 1811
Copyright
© Microscopy Society of America 2017 

References

[1] Egerton, R.F. in Electron Energy-Loss Spectroscopy in the Electron Microscope. Springer New York.Google Scholar
[2] Alexander, J.A., et al., J. Mater. Chem. A 4 2016). p 13636–13645.CrossRefGoogle Scholar
[3] Alexander, J.A., et al, Ultramicroscopy 2017). (under review).Google Scholar
[4] The authors would like to thank all collaborators and technical support at both the Center for Electron Microscopy (CEMAS) at The Ohio State University and the Materials and Manufacturing Directorate at the Air Force Research Laboratory (AFRL) at Wright-Patterson Air Force Base. Funding was provided by an AFRL/DAGSI Ohio-Student Faculty Research Fellowship awarded by the Air Force Laboratory Manufacturing and Materials Directorate, and by The Ohio State University through a Distinguished University Fellowship. The SuperSTEM Laboratory is the U.K. National Facility for Aberration-Corrected Scanning Transmission Electron Microscopy, supported by the Engineering and Physical Sciences Research Council (EPSRC).Google Scholar