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Design Features and Ultimate Performance of an Ultra-High Resolution Aberration-Corrected, Monochromatized 200 keV FEG-TEM éáúüø

Published online by Cambridge University Press:  01 August 2005

A E Thesen ,
M Matijevic  and
G Benner
A E Thesen
Affiliation:
Carl Zeiss
M Matijevic
Affiliation:
Carl Zeiss
G Benner
Affiliation:
Carl Zeiss

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

Type
Research Article
Information
Microscopy and Microanalysis , Volume 11 , Issue S02 , August 2005 , pp. 2144 - 2145
Copyright
© 2005 Microscopy Society of America