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Defect-Induced Electronic Structure Changes in Cesium Lead Halide Nanocrystals

Published online by Cambridge University Press:  05 August 2019

Arashdeep Singh Thind ,
Jordan A. Hachtel ,
Guangfu Luo ,
Maria V. Morrell ,
Yangchuan Xing ,
Juan Carlos Idrobo  and
Rohan Mishra
Arashdeep Singh Thind
Affiliation:
Institute of Materials Science & Engineering, Washington University in St. Louis, St. Louis MO, USA.
Jordan A. Hachtel
Affiliation:
Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN, USA.
Guangfu Luo
Affiliation:
Department of Mechanical Engineering & Materials Science, Washington University in St. Louis, St. Louis, MO, USA. Department of Materials Science and Engineering, Southern University of Science and Technology, Guangdong Sheng, China.
Maria V. Morrell
Affiliation:
Department of Chemical Engineering, University of Missouri, Columbia, MO, USA.
Yangchuan Xing
Affiliation:
Department of Chemical Engineering, University of Missouri, Columbia, MO, USA.
Juan Carlos Idrobo
Affiliation:
Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN, USA.
Rohan Mishra
Affiliation:
Institute of Materials Science & Engineering, Washington University in St. Louis, St. Louis MO, USA. Department of Mechanical Engineering & Materials Science, Washington University in St. Louis, St. Louis, MO, USA.

Abstract

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Type
Current Trends and Challenges in Electron Energy-Loss Spectroscopy
Information
Microscopy and Microanalysis , Volume 25 , Supplement S2 , August 2019 , pp. 660 - 661
Copyright
Copyright © Microscopy Society of America 2019 

References

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[2]Yin, W-J, Shi, T and Yan, Y, Appl. Phys. Lett. 104 (2014), p. 063903.Google Scholar
[3]Morrell, MV et al. , ACS Applied Nano Materials 1 (2018), p. 6091.Google Scholar
[4]Thind, AS et al. , Adv. Mater. 31 (2019), p. e1805047.Google Scholar
[5]Krivanek, OL et al. , Ultramicroscopy (2018). doi: 10.1016/j.ultramic.2018.12.006.Google Scholar
[6]AST and RM acknowledge support from National Science Foundation (NSF DMR-1806147). A portion of the microscopy research was performed as part of a user proposal at Oak Ridge National Laboratory's (ORNL) Center for Nanophase Materials Sciences (CNMS), which is a U.S. Department of Energy (DOE), Office of Science User Facility. This research was conducted, in part, using instrumentation within ORNL's Materials Characterization Core provided by UT-Battelle, LLC under Contract No. DE-AC05-00OR22725 with the U.S. DOE. This work used the computational resources of XSEDE, which is supported by NSF grants ACI-1053575 and ACI-1548562.Google Scholar