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Data Quality Improvements in the Voltage-Pulsed LEAP 5000 R/XR

Published online by Cambridge University Press:  23 September 2015

R.M. Ulfig ,
T.J. Prosa ,
D.R Lenz  and
T.R. Payne
R.M. Ulfig
Affiliation:
CAMECA Instruments, Inc., Madison, WIUSA
T.J. Prosa
Affiliation:
CAMECA Instruments, Inc., Madison, WIUSA
D.R Lenz
Affiliation:
CAMECA Instruments, Inc., Madison, WIUSA
T.R. Payne
Affiliation:
CAMECA Instruments, Inc., Madison, WIUSA

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 21 , Supplement S3: Proceedings of Microscopy & Microanalysis 2015 , August 2015 , pp. 41 - 42
Copyright
Copyright © Microscopy Society of America 2015 

References

[1] Larson, D.J., et al., Local Electrode Atom Probe Tomography. Springer, New York, 2014.CrossRefGoogle Scholar
[2] Unpublished customer survey, CAMECA Instruments Inc., (2015).Google Scholar
[3] Miller, M. K. & Smith, G.D.W., Vac. Sci. and Tech 19, 1981). p. 57.Google Scholar
[4] Ulfig, R.M., et al., Microscopy and Microanalysis 19 S2, 2013). p. 986.Google Scholar
[5] The authors would like to thank Montanuniversitat Leoben, University of Sydney, Oxford, Alabama, and the University of California Santa Barbara for sharing their pulse mode statistics.Google Scholar