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“Crystallography” of an Amorphous Material Using Electron Nanodiffraction
Published online by Cambridge University Press: 30 July 2020
Abstract
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- Type
- Crystallography at the Nanoscale and MicroED with Electrons and X-rays
- Information
- Copyright
- Copyright © Microscopy Society of America 2020
References
Hwang, J., Melgarejo, Z. H., Kalay, Y. E., Kalay, I., Kramer, M. J., Stone, D. S., Voyles, P. M., Phys. Rev. Lett. 2012, 108, 1.Google Scholar
Zhang, P., Maldonis, J. J., Besser, M. F., Kramer, M. J., Voyles, P. M., Acta Mater. 2016, 109, 103.10.1016/j.actamat.2016.02.006CrossRefGoogle Scholar
Liu, A. C. Y., Neish, M. J., Stokol, G., Buckley, G. A., Smillie, L. A., de Jonge, M. D., Ott, R. T., Kramer, M. J., Bourgeois, L., Phys. Rev. Lett. 2013, 110, 205505.10.1103/PhysRevLett.110.205505CrossRefGoogle Scholar
Gibson, J. M., Treacy, M. M. J., Sun, T., Zaluzec, N. J., Phys. Rev. Lett. 2010, 105, 125504.10.1103/PhysRevLett.105.125504CrossRefGoogle Scholar
Im, S., Chen, Z., Johnson, J. M., Zhao, P., Yoo, G. H., Park, E. S., Wang, Y., Muller, D. A., Hwang, J., Ultramicroscopy 2018, 195, 189.10.1016/j.ultramic.2018.09.005CrossRefGoogle Scholar
Du, Q., Liu, X., Fan, H., Zeng, Q., Wu, Y., Wang, H., Chatterjee, D., Ren, Y., Ke, Y., Voyles, P. M., Lu, Z., Ma, E., Mater. Today 2019, DOI 10.1016/j.mattod.2019.09.002.Google Scholar