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Cryogenic STEM Imaging and Spectroscopy of Electron Beam Sensitive Materials

Published online by Cambridge University Press:  05 August 2019

Katherine A. Spoth ,
Michael J. Zachman ,
David A. Muller  and
Lena F. Kourkoutis
Katherine A. Spoth
Affiliation:
School of Applied and Engineering Physics, Cornell University, Ithaca, NY, USA.
Michael J. Zachman
Affiliation:
School of Applied and Engineering Physics, Cornell University, Ithaca, NY, USA.
David A. Muller
Affiliation:
School of Applied and Engineering Physics, Cornell University, Ithaca, NY, USA. Kavli Institute at Cornell for Nanoscale Science, Cornell University, Ithaca, NY, USA.
Lena F. Kourkoutis*
Affiliation:
School of Applied and Engineering Physics, Cornell University, Ithaca, NY, USA. Kavli Institute at Cornell for Nanoscale Science, Cornell University, Ithaca, NY, USA.
*
*Corresponding author: lena.f.kourkoutis@cornell.edu

Abstract

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Type
Revealing the Fundamental Structure of Soft and Hard Matter by Minimizing Beam-Sample Interactions
Information
Microscopy and Microanalysis , Volume 25 , Supplement S2 , August 2019 , pp. 1660 - 1661
Copyright
Copyright © Microscopy Society of America 2019 

Footnotes

2

Present address: Center for Nanophase Materials Sciences, ORNL, Oak Ridge, TN, USA.

References

[1]Li, Y et al. , Science 358 (2017), p. 506.Google Scholar
[2]Wang, X et al. , Nano Lett. 17 (2017), p. 7606.Google Scholar
[3]Zachman, MJ et al. , Nature 560 (2018), p. 345.Google Scholar
[4]Egerton, RF, Li, P and Malac, M, Micron 35 (2004), p. 399.Google Scholar
[5]Tate, MW et al. , Microscopy and Microanalysis 22 (2016), p. 237.Google Scholar
[6]Supported by NSF (DMR-1654596, DMR-1429155, DMR-1719875) and the Packard Foundation.Google Scholar