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Correlative Tomography - Bridging the length-scales through correlative X-ray and Electron Imaging

Published online by Cambridge University Press:  30 July 2021

Philip Withers ,
Jack Donoghue  and
Timothy Burnett
Philip Withers
Affiliation:
University of Manchester, Manchester, England, United Kingdom
Jack Donoghue
Affiliation:
University of Manchester, Manchester, England, United Kingdom
Timothy Burnett
Affiliation:
The University of Manchester, Manchester, United Kingdom

Abstract

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Type
Nanoscale x-ray and Electron Microscopy Techniques and Applications in Material Science
Information
Microscopy and Microanalysis , Volume 27 , Supplement S1 , August 2021 , pp. 932 - 933
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Copyright
Copyright © The Author(s), 2021. Published by Cambridge University Press on behalf of the Microscopy Society of America

References

Echlin, M.P., et al. , Serial sectioning in the SEM for three dimensional materials science. Current Opinion in Solid State and Materials Science, 2020. 24(2): p. 100817.CrossRefGoogle Scholar
Withers, P.J. and Burnett, T.L., Rich multi-dimensional correlative imaging. IOP Conference Series: Materials Science and Engineering, 2019. 580: p. 012014.Google Scholar