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Correlative Probe and Electron Microscopy CPEM™ – The Novel Technology for 3D Material Surface Analysis

Published online by Cambridge University Press:  05 August 2019

Jan Neuman ,
Zdenek Novacek ,
Michal Pavera  and
Veronika Novotna
Jan Neuman*
Affiliation:
NenoVision s.r.o, Brno, Czech Republic.
Zdenek Novacek
Affiliation:
NenoVision s.r.o, Brno, Czech Republic.
Michal Pavera
Affiliation:
NenoVision s.r.o, Brno, Czech Republic.
Veronika Novotna
Affiliation:
NenoVision s.r.o, Brno, Czech Republic.
*
*Corresponding author: jan.neuman@nenovision.com

Abstract

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Type
Leveraging 3D Imaging and Analysis Methods for New Opportunities in Material Science
Information
Microscopy and Microanalysis , Volume 25 , Supplement S2 , August 2019 , pp. 430 - 431
Copyright
Copyright © Microscopy Society of America 2019 

References

[1]NenoVision, www.nenovision.com (02-22, 2019).Google Scholar
[2]Gwyddion – Free SPM (AFM, SNOM/NSOM, STM, MFM, …) data analysis software, www.gwyddion.net (02-22, 2019).Google Scholar