Hostname: page-component-848d4c4894-cjp7w Total loading time: 0 Render date: 2024-06-20T16:33:24.037Z Has data issue: false hasContentIssue false

Correlating Automated High-Throughput ADF-STEM and 4D-STEM Imaging for the Characterization of Irradiation-Induced Defects

Published online by Cambridge University Press:  22 July 2022

Alex Lin
Affiliation:
National Center for Electron Microscopy, Molecular Foundry, Lawrence Berkeley National Laboratory, Berkeley, CA, United States
Sean H. Mills
Affiliation:
National Center for Electron Microscopy, Molecular Foundry, Lawrence Berkeley National Laboratory, Berkeley, CA, United States Department of Materials Science and Engineering, University of California, Berkeley, CA, United States
Alexander Pattison
Affiliation:
National Center for Electron Microscopy, Molecular Foundry, Lawrence Berkeley National Laboratory, Berkeley, CA, United States
Wolfgang Theis
Affiliation:
Nanoscale Physics Research Laboratory, School of Physics and Astronomy, University Birmingham, Birmingham, United Kingdom
Andrew Minor
Affiliation:
National Center for Electron Microscopy, Molecular Foundry, Lawrence Berkeley National Laboratory, Berkeley, CA, United States Department of Materials Science and Engineering, University of California, Berkeley, CA, United States
Peter Ercius*
Affiliation:
National Center for Electron Microscopy, Molecular Foundry, Lawrence Berkeley National Laboratory, Berkeley, CA, United States
*
*Corresponding author: percius@lbl.gov

Abstract

Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Correlative Microscopy and High-Throughput Characterization for Accelerated Development of Materials in Extreme Environments
Copyright
Copyright © Microscopy Society of America 2022

References

Schmidt, F et al. , Annual Review of Materials Research 51 (2021), p. 293.CrossRefGoogle Scholar
Guo, Q et al. , Small 9 (2013), p. 691.CrossRefGoogle ScholarPubMed
Zhou, W et al. , Nature Communications 11, (2020), p. 3430.CrossRefGoogle Scholar
Ophus, C, Microscopy and Microanalysis 25 (2019), p. 563-582.CrossRefGoogle Scholar
Ercius, P et al. , Microscopy and Microanalysis 26 (S2) (2020), p. 1896.CrossRefGoogle Scholar
Zeltmann, SE et al. , Ultramicroscopy 209 (2020), p. 112890.CrossRefGoogle Scholar
Ophus, C, Ciston, J and Nelson, CT, Ultramicroscopy 162 (2016), p. 1.CrossRefGoogle Scholar
Primary support for this work came from FUTURE (Fundamental Understanding of Transport Under Reactor Extremes), an Energy Frontier Research Center funded by the U.S. Department of Energy, Office of Science, Basic Energy Sciences. Work at the Molecular Foundry was supported by the Office of Science, Office of Basic Energy Sciences, of the U.S. Department of Energy under Contract No. DE-AC02-05CH11231.Google Scholar