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Confocal Raman Line-Scanned Imaging of Complex Geological and Histological Thin Sections

Published online by Cambridge University Press:  02 July 2020

Fran Adar
Affiliation:
Instruments, S.A., Inc. Edison, NJ08820
Roussel Bernard
Affiliation:
Dilor/ISA, 59000Lille, France
Alian Wang
Affiliation:
Dept. of Earth and Planetary Sciences, Washington University, St. Louis, MI63130
Shari Hawi
Affiliation:
Dept. of Pharmacology, Medical College of Wisconsin, Milwaukee, WI53226-0509
Kasem Nithipathikom
Affiliation:
Dept. of Pharmacology, Medical College of Wisconsin, Milwaukee, WI53226-0509
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Extract

Chemical imaging of complex multi-component materials has important potential for the analyst in many fields of research. Raman imaging is of particular interest for several reasons. The Raman spectra contain detailed information on chemical species and crystalline phase. Because the Raman effect is excited by optical radiation, the spatial resolution, which is proportional to the wavelength of the light, is better than 1 μm. and with near field optical techniques currently under development, there is potential for even higher spatial resolution in the chemical image.

The methods used to produce an image fall into essentially two categories - global imaging and confocal mapping. When creating global images, a large area of the sample is bathed in laser light. The light scattered by the sample is filtered to select a Raman band, and then that light is used to create an image of the sample on a two-dimensional detector.

Type
Optical Microanalysis
Copyright
Copyright © Microscopy Society of America 1997

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References

1. Delhaye, M. and Dhamelincourt, P.J. Raman Spectrosc. 3 (1975)33CrossRefGoogle Scholar

2. Smith, D.A., et al., Ultramicroscopy 61(1995)247CrossRefGoogle Scholar

3. Grausen, J., et al., FACSS 1997Google Scholar

4. Barbillat, J., Delhaye, M., and Dhamelincourt, P.Microbeam Analysis (1992)1514Google Scholar