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Conductance Imaging of Cell-Cell Contacts with Scanning Ion Conductance Microscopy (SICM)

Published online by Cambridge University Press:  07 September 2007

M Böcker ,
A Engbert  and
T E Schäffer
M Böcker
Affiliation:
University of Münster,Germany
A Engbert
Affiliation:
University of Münster,Germany
T E Schäffer
Affiliation:
University of Münster,Germany
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Extract

Extended abstract of a paper presented at MC 2007, 33rd DGE Conference in Saarbrücken, Germany, September 2 – September 7, 2007

Type
Research Article
Information
Microscopy and Microanalysis , Volume 13 , Issue S03 , September 2007 , pp. 216 - 217
Copyright
Copyright © Microscopy Society of America 2007

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