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A Computer Program for Objective Point Symmetry Classifications of Electron Diffraction Spot Patterns with Apparent Hexagonal or Rectangular-Centered Lattice Metric

Published online by Cambridge University Press:  22 July 2022

Lukas von Koch*
Affiliation:
Westside Christian High School, Portland, Oregon, USA Department of Physics, Portland State University, Portland, Oregon, USA
Peter Moeck*
Affiliation:
Department of Physics, Portland State University, Portland, Oregon, USA

Abstract

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Type
Microcrystal Electron Diffraction (MicroED)
Copyright
Copyright © Microscopy Society of America 2022

References

Moeck, P, Acta Cryst. A, vol. 78, 2022, in print, 23 pages, doi: 10.1107/S2053273322000845, (expanded version, 35 pages, arXiv: 2108.00829, Jan. 4, 2022).CrossRefGoogle Scholar
Dempsey, A and Moeck, P, 74 pages, arXiv: 2009.08539, Dec. 15, 2020.Google Scholar
Moeck, P, Symmetry 10 (2018), p. 133.CrossRefGoogle Scholar
Moeck, P in “Microscopy and Imaging Science: Practical Approaches to Applied Research and Education”, ed. Méndez-Villas, A., (Badajoz: FORMATEX, 2017) p. 503; arXiv: 2011.13102v2.Google Scholar
Zou, X, Hovmöller, S, and Oleynikov, P, Electron Crystallography: Electron Microscopy and Electron Diffraction, (Oxford University Press, 2011).Google Scholar
Moeck, P and von Koch, L, arXiv: 2201.04789, 4 pages, Jan.-Feb. 2022.Google Scholar
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This work was supported by a Faculty Enhancement Grant from Portland State University to the second (and corresponding) author. The described computer program can be obtained from the first author on request.Google Scholar