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Comparison of Analysis Routines for EDS and EELS Spectrum Images of Electrical Contacts to Single-Walled Carbon Nanotubes

Published online by Cambridge University Press:  27 August 2014

Joshua D. Sugar ,
Alexander A. Kane ,
Alexandra C. Ford ,
Michael J. Rye ,
Lisa M. Lowery  and
François Léonard
Joshua D. Sugar
Affiliation:
Sandia National Laboratories, Livermore, CA, USA
Alexander A. Kane
Affiliation:
Sandia National Laboratories, Livermore, CA, USA
Alexandra C. Ford
Affiliation:
Sandia National Laboratories, Livermore, CA, USA
Michael J. Rye
Affiliation:
Sandia National Laboratories, Albuquerque, NM, USA
Lisa M. Lowery
Affiliation:
Sandia National Laboratories, Albuquerque, NM, USA
François Léonard
Affiliation:
Sandia National Laboratories, Livermore, CA, USA

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 20 , Supplement S3: Proceedings of Microscopy & Microanalysis 2014 , August 2014 , pp. 618 - 619
Copyright
Copyright © Microscopy Society of America 2014 

References

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