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Combining Transmission Kikuchi Diffraction and Scanning Transmission Electron Microscopy for Irradiated Materials Studies

Published online by Cambridge University Press:  04 August 2017

Chad M. Parish
Affiliation:
Oak Ridge National Laboratory, Oak Ridge, TN, USA
Kun Wang
Affiliation:
Oak Ridge National Laboratory, Oak Ridge, TN, USA
Philip D. Edmondson
Affiliation:
Oak Ridge National Laboratory, Oak Ridge, TN, USA
Kurt A. Terrani
Affiliation:
Oak Ridge National Laboratory, Oak Ridge, TN, USA
Xunxiang Hu
Affiliation:
Oak Ridge National Laboratory, Oak Ridge, TN, USA
Rachel L. Seibert
Affiliation:
Illinois Institute of Technology, Chicago, IL, USA
Yutai Katoh
Affiliation:
Oak Ridge National Laboratory, Oak Ridge, TN, USA
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Abstract

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© Microscopy Society of America 2017 

References

[1] Sneddon, G.C., et al, Mat Sci Eng R 110 2016). p. 1.CrossRefGoogle Scholar
[2] Parish, C. M., et al, Scripta Mat 127 2017). p. 132.CrossRefGoogle Scholar
[3] Parish, C. M., Wang, K. & Edmondson, P. D. Scripta Mat. Viewpoint, in press.Google Scholar
[4] Parish, C.M., etal, Microsc. Microan. Conf. Proc 21 2015). p. 1003.CrossRefGoogle Scholar
[6] This work is supported by an Early Career Research Program award, US Department of Energy, Office of Science, Fusion Energy Sciences, under contract number DE-AC05-00OR22725. Silicon carbide and fuel work supported by Fuel Cycle R&D, Office of Nuclear Energy, US DOE. FEI Talos F200X S/TEM provided by the Department of Energy, Office of Nuclear Energy, Fuel Cycle R&D Program and the Nuclear Science User Facilities.Google Scholar
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