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Chemical Bonding State Analysis with High Energy-resolution Carbon K-Emission Spectrum of Soft Materials Obtained by Soft X-ray Emission Spectrometer

Published online by Cambridge University Press:  22 July 2022

Masaru Takakura ,
Takanori Murano ,
Shogo Koshiya ,
Peter McSwiggen  and
Vernon Robertson
Masaru Takakura
Affiliation:
SA Business Unit JEOL Ltd. 3-1-2 Musashino, Akishima, Tokyo, Japan
Takanori Murano
Affiliation:
SA Business Unit JEOL Ltd. 3-1-2 Musashino, Akishima, Tokyo, Japan
Shogo Koshiya
Affiliation:
SA Business Unit JEOL Ltd. 3-1-2 Musashino, Akishima, Tokyo, Japan
Peter McSwiggen
Affiliation:
JEOL USA Inc., 11 Dearborn Road, Peabody, MA, United States
Vernon Robertson
Affiliation:
JEOL USA Inc., 11 Dearborn Road, Peabody, MA, United States

Abstract

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Type
On Demand - Surface and Subsurface Microscopy and Microanalysis of Physical and Biological Specimens
Information
Microscopy and Microanalysis , Volume 28 , Supplement S1 , August 2022 , pp. 1014 - 1015
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Copyright
Copyright © Microscopy Society of America 2022

References

Terauchi, M., et al. : J. Electron Microscopy, 61, (2012) 1.10.1093/jmicro/dfr076CrossRefGoogle Scholar
Takakura, M., et al. : Proc. of AMAS XV (2019) 26.Google Scholar
Tegeler, E., et al. : Phys. Stat. Sol. (b) 84, (1977) 561.10.1002/pssb.2220840219CrossRefGoogle Scholar
Schmidt, M.W., et al. , J. Comput. Chem., 14, (1993) 1347.10.1002/jcc.540141112CrossRefGoogle Scholar