Hostname: page-component-848d4c4894-8kt4b Total loading time: 0 Render date: 2024-06-17T14:38:26.462Z Has data issue: false hasContentIssue false
  • English
  • Français

Charge Contrast Imaging (CCI) in the Environmental Scanning Electron Microscope: Optimizing Operating Parameters for Calcite

Published online by Cambridge University Press:  02 July 2020

Eric Doehne  and
David Carson
Eric Doehne
Affiliation:
The Getty Conservation Institute, 1200 Getty Center Drive, Suite 700, Los Angeles, CA, 90049, USA TEL: (310) 440 6237 Email:edoehne@gettv.edu
David Carson
Affiliation:
The Getty Conservation Institute, 1200 Getty Center Drive, Suite 700, Los Angeles, CA, 90049, USA TEL: (310) 440 6237 Email:edoehne@gettv.edu
Get access

Abstract

Charge contrast imaging (CCI) is a useful new method for imaging sub-micron features in crystalline materials using the unique gas/ion/electron imaging system of the environmental scanning electron microscope (Griffin, 1997; Doehne, 1998). Crystal growth zoning, microfractures, solution boundaries, and areas of chemical alteration or recrystallization can be imaged in a wide range of materials (Griffin, 2000; Watt, et al. 2000). While not fully understood, charge contrast images reflect differences in the ability of materials to accept, store and discharge deposited electrons from the primary electron beam. These differences are expressed, in turn, as contrasts in secondary electron emission from flat samples (e.g. these contrasts are not related to topography, as is usually the case). Charge contrast appears be related to differences in electronic properties which are often controlled by defect density. CCI is also affected by small-scale physical defects (such as microfractures) which appear to affect the distribution and timing of charge buildup and discharge in the sample (Johansen, et al. 1997).

Type
Technologists’ Forum: ESEM/Lv/Vp: Imaging at Low Vacuum (Organized by J. Killius)
Information
Microscopy and Microanalysis , Volume 7 , Issue S2: Proceedings: Microscopy & Microanalysis 2001, Microscopy Society of America 59th Annual Meeting, Microbeam Analysis Society 35th Annual Meeting, Long Beach, California August 5-9, 2001 , August 2001 , pp. 780 - 781
Copyright
Copyright © Microscopy Society of America 2001

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

Doehne, E.: Charge contrast: some ESEM observations of a new/old phenomena. in Baily, G.W., Ed., Microscopy and Microanalysis 1997, 4 (Supplement 2), 292–293, Springer, Atlanta, Georgia. (1998).Google Scholar
Griffin, B. J.Charge contrast imaging of material growth and defects in the environmental scanning electron microscopy - Linking electron emission and cathodoluminescence. Scanning 22:234–242 (2000).CrossRefGoogle ScholarPubMed
Griffin, B. J.: A new mechanism for the imaging of crystal structure in non-conductive materials: An application of charge-induced contrast in the environmental scanning electron microscope (ESEM). in Baily, G.W., et al, Eds., Microscopy and Microanalysis 1996, 3, (Supplement 2), 1197–1198 (1997).CrossRefGoogle Scholar
Harker, A. B., Howitt, D. G., DeNatale, J. F.. and Flintoff, J. F.: Charge-sensitive secondary electron imaging of diamond microstructures. Scanning, 16, 87–90 (1994).CrossRefGoogle Scholar
Johansen, H., Erfurth, W.Gogoll, S., Stenzel, E., Reichling, M., and Matthias, E.: Scanning electron microscopy imaging of microcracks and charging phenomena on a laser-damaged CaF2 surface. Scanning, 19, 416–425 (1997).Google Scholar
Sawyer, G. R. and T.F., Page: Microstructural characterization of'REFEL' reaction bonded silicon carbide. Journal of Materials Science. 13,885–904(1978).CrossRefGoogle Scholar
Watt, G. R., Griffin, B.J., Kinny, P.D.: Charge contrast imaging of geological materials in the environmental scanning electron microscope. American Mineralogist, 85:1784–1794 (2000).CrossRefGoogle Scholar