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Characterization of Real Materials with Low Voltage STEM (30 kV): Current State and Challenges

Published online by Cambridge University Press:  30 July 2021

Nicolas Brodusch  and
Raynald Gauvin
Nicolas Brodusch
Affiliation:
McGill University, Montreal, Quebec, Canada
Raynald Gauvin
Affiliation:
McGill University, Montreal, Quebec, Canada

Abstract

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Type
Advances in Analytical STEM-in-SEM
Information
Microscopy and Microanalysis , Volume 27 , Supplement S1 , August 2021 , pp. 1318 - 1320
Copyright
Copyright © The Author(s), 2021. Published by Cambridge University Press on behalf of the Microscopy Society of America

References

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