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Characterization of Nano-Scale Defects in Pulsed Laser Deposited (PLD) Thin Films of Li3xNd(2/3-x)(1/3-2x)TiO3 (NLTO) by Aberration Corrected HR-STEM Imaging and Dual-EELS
Published online by Cambridge University Press: 30 July 2020
Abstract
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- Type
- Energy and Soft Materials and the Development of Cryogenic Techniques for Studying Them
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- Copyright © Microscopy Society of America 2020