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Characterization of Nanoclay / Polymer Systems: A Combination of TEM, XRD and Image Analysis

Published online by Cambridge University Press:  26 July 2009

O Guise ,
A Berzinis ,
R Kamalakaran  and
S Franklin
O Guise
Affiliation:
SABIC Innovative Plastics
A Berzinis
Affiliation:
SABIC Innovative Plastics
R Kamalakaran
Affiliation:
GE India Technology Center,India
S Franklin
Affiliation:
GE India Technology Center,India

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

Type
Abstract
Information
Microscopy and Microanalysis , Volume 15 , Supplement S2 , July 2009 , pp. 1330 - 1331
Copyright
Copyright © Microscopy Society of America 2009