Hostname: page-component-76fb5796d-2lccl Total loading time: 0 Render date: 2024-04-26T00:41:51.445Z Has data issue: false hasContentIssue false
  • English
  • Français

Characterization of Gold on Silicon Nanowires using Aberration-corrected STEM

Published online by Cambridge University Press:  05 August 2007

SH Oh ,
K van Benthem ,
SI Molina ,
P Werner ,
D Kumar  and
S Pennycook
SH Oh
Affiliation:
North Carolina A & T State University
K van Benthem
Affiliation:
Oak Ridge National Laboratory
SI Molina
Affiliation:
Oak Ridge National Laboratory
P Werner
Affiliation:
Max Planck Institute of Microstructure Physics,Germany
D Kumar
Affiliation:
North Carolina A & T State University
S Pennycook
Affiliation:
Oak Ridge National Laboratory
Get access

Extract

Extended abstract of a paper presented at Microscopy and Microanalysis 2007 in Ft. Lauderdale, Florida, USA, August 5 – August 9, 2007

Type
Research Article
Information
Microscopy and Microanalysis , Volume 13 , Issue S02 , August 2007 , pp. 758 - 759
Copyright
© 2007 Microscopy Society of America

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)