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Characterization of Boron Containing Graphite Using TEM and EELS

Published online by Cambridge University Press:  01 August 2002

J.S. Kim ,
S.J. Kim ,
G.H. Kim ,
C.H. Chun  and
H.H. Koo
J.S. Kim
Affiliation:
Materials R&D Division, Agency for Defense Development, Yusung PO Box 35-5, Deajon, 305- 600, South Korea
S.J. Kim
Affiliation:
Materials R&D Division, Agency for Defense Development, Yusung PO Box 35-5, Deajon, 305- 600, South Korea
G.H. Kim
Affiliation:
Materials R&D Division, Agency for Defense Development, Yusung PO Box 35-5, Deajon, 305- 600, South Korea
C.H. Chun
Affiliation:
Materials R&D Division, Agency for Defense Development, Yusung PO Box 35-5, Deajon, 305- 600, South Korea
H.H. Koo
Affiliation:
Materials R&D Division, Agency for Defense Development, Yusung PO Box 35-5, Deajon, 305- 600, South Korea

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 8 , Issue S02 , August 2002 , pp. 610 - 611
Copyright
Copyright © Microscopy Society of America 2002