No CrossRef data available.
Article contents
Channeling of Aberration-corrected STEM Probes at the “Sub-atomic” Scale
Published online by Cambridge University Press: 27 August 2014
Abstract
An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
![Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'](https://static.cambridge.org/content/id/urn%3Acambridge.org%3Aid%3Aarticle%3AS1431927614002451/resource/name/firstPage-S1431927614002451a.jpg)
- Type
- Abstract
- Information
- Microscopy and Microanalysis , Volume 20 , Supplement S3: Proceedings of Microscopy & Microanalysis 2014 , August 2014 , pp. 146 - 147
- Copyright
- Copyright © Microscopy Society of America 2014
References
[9]
Kirkland, E.J. Advanced Computing in Electron Microscopy, (Springer, New York (2010).Google Scholar
[11] This research was supported by NSF DMR-1006706. Simulations were performed using Minnesota Supercomputing Institute resources. Drs. M. Cococcioni and B. Himmetoglu are thanked for density functional theory calculations of bonding charge density.Google Scholar