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The challenge of imaging hard/soft matter interfaces at atomic resolution

Published online by Cambridge University Press:  23 November 2012

B. Barton ,
R. Buonsanti ,
A. Dong ,
D. Milliron ,
C.F. Kisielowski ,
L.P. Hansen ,
S. Helveg  and
B. Jiang
B. Barton
Affiliation:
Materials Science, Lawrence Berkeley National Laboratory, Berkeley, CA
R. Buonsanti
Affiliation:
Materials Science, Lawrence Berkeley National Laboratory, Berkeley, CA
A. Dong
Affiliation:
Materials Science, Lawrence Berkeley National Laboratory, Berkeley, CA
D. Milliron
Affiliation:
Materials Science, Lawrence Berkeley National Laboratory, Berkeley, CA
C.F. Kisielowski
Affiliation:
Materials Science, Lawrence Berkeley National Laboratory, Berkeley, CA
L.P. Hansen
Affiliation:
Haldor Topsøe A/S, DK-2800 Kgs. Lyngby, Denmark
S. Helveg
Affiliation:
Haldor Topsøe A/S, DK-2800 Kgs. Lyngby, Denmark
B. Jiang
Affiliation:
FEI Company, Hillsboro, OR
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Abstract

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Type
Research Article
Information
Microscopy and Microanalysis , Volume 18 , Issue S2: Proceedings of Microscopy & Microanalysis 2012 , July 2012 , pp. 1606 - 1607
Copyright
Copyright © Microscopy Society of America 2012

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