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Cathodoluminescence Hyperspectral Imaging of Nitride Semiconductors: Introducing New Variables

  • Paul R. Edwards (a1), Michael J. Wallace (a1), Gunnar Kusch (a1), Gunasekar Naresh-Kumar (a1), Jochen Bruckbauer (a1), Carol Trager-Cowan (a1), Kevin P. O’Donnell (a1) and Robert W. Martin (a1)...
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Abstract

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References

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[1] Edwards, P. R., Martin, R. W. Semiconductor Science and Technology 26 (2011), p. 064005.
[2] Edwards, P. R., et al, Physica Status Solidi C 0 (2003), p. 2474.
[3] MacRae, C. M., et al, Microscopy and Microanalysis 18 (2012), p. 1239.
[4] Naresh-Kumar, G., et al, Microscopy and Microanalysis 20 ( (2014), p. 55; see also abstract by C. Trager-Cowan et al, this volume.
[5] Wallace, M. J., et al, submitted (07 Feb (2014) to Journal of Applied Physics.
[6] Kusch, G., et al, submitted (18 Dec (2013) to Applied Physics Letters.
[7] This work was funded by the U.K. Engineering and Physical Sciences Research Council. The authors gratefully acknowledge the provision of samples by the Tyndall National Institute (Republic of Ireland), the University of Cambridge (U.K.) and the University of Bath (U.K.).

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