No CrossRef data available.
Article contents
Carrier Collective Excitations in Degenerate Semiconductors Studied by EELS
Published online by Cambridge University Press: 30 July 2020
Abstract
An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
![Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'](https://static.cambridge.org/content/id/urn%3Acambridge.org%3Aid%3Aarticle%3AS1431927620019844/resource/name/firstPage-S1431927620019844a.jpg)
- Type
- Impact of Recent Advancement in Instrumentation/Detectors on Electron Energy Loss Spectroscopy for Physical and Biological Sciences
- Information
- Copyright
- Copyright © Microscopy Society of America 2020
References
Pettit, R. B., Silcox, J., and Vincent, R.. Phys. Rev. B 11 (8), 3116 (1975).10.1103/PhysRevB.11.3116CrossRefGoogle Scholar
Govyadinov, A. A., et al. . Nat. Commun. 8, 95 (2017).10.1038/s41467-017-00056-yCrossRefGoogle Scholar