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Calibration of Atom Probe Tomography Reconstructions Through Correlation with Electron Micrographs

Published online by Cambridge University Press:  04 February 2019

Isabelle Mouton Open the ORCID record for Isabelle Mouton [Opens in a new window] ,
Shyam Katnagallu ,
Surendra Kumar Makineni ,
Oana Cojocaru-Mirédin ,
Torsten Schwarz ,
Leigh Thomas Stephenson ,
Dierk Raabe  and
Baptiste Gault Open the ORCID record for Baptiste Gault [Opens in a new window]
Isabelle Mouton*
Affiliation:
Max-Planck-Institut für Eisenforschung GmbH, Max-Planck-Straße 1, 40237 Düsseldorf, Germany
Shyam Katnagallu
Affiliation:
Max-Planck-Institut für Eisenforschung GmbH, Max-Planck-Straße 1, 40237 Düsseldorf, Germany
Surendra Kumar Makineni
Affiliation:
Max-Planck-Institut für Eisenforschung GmbH, Max-Planck-Straße 1, 40237 Düsseldorf, Germany
Oana Cojocaru-Mirédin
Affiliation:
RWTH Aachen, I. Physikalisches Institut IA, Sommerfeldstraße 14, 52074 Aachen, Germany
Torsten Schwarz
Affiliation:
Max-Planck-Institut für Eisenforschung GmbH, Max-Planck-Straße 1, 40237 Düsseldorf, Germany
Leigh Thomas Stephenson
Affiliation:
Max-Planck-Institut für Eisenforschung GmbH, Max-Planck-Straße 1, 40237 Düsseldorf, Germany
Dierk Raabe
Affiliation:
Max-Planck-Institut für Eisenforschung GmbH, Max-Planck-Straße 1, 40237 Düsseldorf, Germany
Baptiste Gault
Affiliation:
Max-Planck-Institut für Eisenforschung GmbH, Max-Planck-Straße 1, 40237 Düsseldorf, Germany
*
*Author for correspondence: I. Mouton, E-mail: isabelle.mouton42@gmail.com
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Abstract

Although atom probe tomography (APT) reconstructions do not directly influence the local elemental analysis, any structural inferences from APT volumes demand a reliable reconstruction of the point cloud. Accurate estimation of the reconstruction parameters is crucial to obtain reliable spatial scaling. In the current work, a new automated approach of calibrating atom probe reconstructions is developed using only one correlative projection electron microscopy (EM) image. We employed an algorithm that implements a 2D cross-correlation of microstructural features observed in both the APT reconstructions and the corresponding EM image. We apply this protocol to calibrate reconstructions in a Cu(In,Ga)Se2-based semiconductor and in a Co-based superalloy. This work enables us to couple chemical precision to structural information with relative ease.

Keywords

atom probe tomographycorrelationelectron microscopyreconstruction algorithm
Type
Reconstruction
Information
Microscopy and Microanalysis , Volume 25 , Special Issue 2: Atom Probe Tomography and Microscopy APT&M 2018 , April 2019 , pp. 301 - 308
Copyright
Copyright © Microscopy Society of America 2019 

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