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Bridging Industry to Beamline through an Advanced Laboratory-Based Characterisation Facility

Published online by Cambridge University Press:  05 August 2019

Richard E Johnston*
Affiliation:
Advanced Imaging of Materials (AIM) Facility, College of Engineering, Swansea University, Swansea, UK.
Cameron Pleydell-Pearce
Affiliation:
Advanced Imaging of Materials (AIM) Facility, College of Engineering, Swansea University, Swansea, UK.
Alan Clarke
Affiliation:
TWI Technology Centre (Wales), Port Talbot, UK.
Kyriakos Mouzakitis
Affiliation:
TWI Technology Centre (Wales), Port Talbot, UK.
Leon Wechie
Affiliation:
TWI Technology Centre (Wales), Port Talbot, UK.
Ling Xu
Affiliation:
Science and Technology Facilities Council (STFC), Harwell, UK.
Ric Allott
Affiliation:
Science and Technology Facilities Council (STFC), Harwell, UK.
*
*Corresponding author: r.johnston@swansea.ac.uk

Abstract

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Type
Microscopy and Microanalysis for Real-World Problem Solving
Copyright
Copyright © Microscopy Society of America 2019 

References

[2]The authors would like to acknowledge the financial support of the Bridging for Innovators Programme funded by BEIS, the Science and Technology Facilities Council (STFC) Grant No. ST/R006105/1, and the Engineering and Physical Sciences Research Council (EPSRC) Grant No. EP/M028267/1, and the European Social Fund (ESF) through the European Union's Convergence programme administered by the Welsh GovernmentGoogle Scholar