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Bandgap State Mapping via Valence-Loss EELS at Grain Boundaries in Non-Stoichiometric PrxCe1-xO2-δ

Published online by Cambridge University Press:  25 July 2016

William J. Bowman ,
Eva Sediva ,
Jennifer L.M. Rupp  and
Peter A. Crozier
William J. Bowman
Affiliation:
School for the Engineering of Matter, Transport and Energy, Arizona State University, Tempe, AZ, USA Electrochemical Materials Group, ETH Zürich, Zürich, Switzerland
Eva Sediva
Affiliation:
Electrochemical Materials Group, ETH Zürich, Zürich, Switzerland
Jennifer L.M. Rupp
Affiliation:
Electrochemical Materials Group, ETH Zürich, Zürich, Switzerland
Peter A. Crozier
Affiliation:
School for the Engineering of Matter, Transport and Energy, Arizona State University, Tempe, AZ, USA

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 22 , Supplement S3: Proceedings of Microscopy & Microanalysis 2016 , July 2016 , pp. 970 - 971
Copyright
© Microscopy Society of America 2016 

References

References:

[1] Bowman, W.J., Zhu, J., Sharma, R. & Crozier, P.A. Solid State Ionics 272 (2015) 9.CrossRefGoogle Scholar
[2] Kim, J.J., Bishop, S.R., Thompson, N.J., Chen, D., et al, Chem. of Mater 26 (2014) 1374.CrossRefGoogle Scholar
[3] Bowman, W.J., March, K., Hernandez, C.A. & Crozier, P.A. Under Review (2016).Google Scholar
[4] Egerton, R.F. Electron Energy-Loss Spectroscopy in the Electron Microscope. Springer, New York (2011). Ed. 3, p. 206.CrossRefGoogle Scholar
[5] W.J.B. was a Swiss Government Excellence Scholarship holder for the academic year 2015-2016 (ESKAS 2015.1183), and acknowledges financial support of the US NSF Graduate Research Fellowship Program (grant DGE-1311230), the NSF Graduate Research Opportunities Worldwide grant, and NSF DMR-1308085.Google Scholar