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Automatic FIB-SEM Preparation of Straight Pillars for Micro-Compression Testing

Published online by Cambridge University Press:  25 July 2016

Tobias Volkenandt ,
Alexandre Laquerre ,
Michal Postolski  and
Fabian Perez-Willard
Tobias Volkenandt
Affiliation:
Carl Zeiss Microscopy GmbH, Oberkochen, Germany
Alexandre Laquerre
Affiliation:
Fibics Incorporated, Ottawa, Canada
Michal Postolski
Affiliation:
Carl Zeiss Microscopy GmbH, Oberkochen, Germany
Fabian Perez-Willard
Affiliation:
Carl Zeiss Microscopy GmbH, Oberkochen, Germany

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 22 , Supplement S3: Proceedings of Microscopy & Microanalysis 2016 , July 2016 , pp. 190 - 191
Copyright
© Microscopy Society of America 2016 

References

References:

[1] Greer, J.R., et al., Acta Matenalia 53 (2005). p. 1821.Google Scholar
[2] Dimiduk, D.M., et al, Acta Materialia 53 (2005). p. 4065.Google Scholar
[3] Uchic, M.D. & Dimiduk, D.M. Mat Sci. Eng. A 400–401 (2005). p. 268.Google Scholar