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Automatic Diffraction Analysis and Lattice Fitting for Convergent-Beam Electron Diffraction Patterns in 4D-STEM

Published online by Cambridge University Press:  30 July 2021

Sihan Wang ,
Tim Eldred ,
Jacob Smith  and
Wenpei Gao
Sihan Wang
Affiliation:
North Carolina State University, North Carolina, United States
Tim Eldred
Affiliation:
North Carolina State University, United States
Jacob Smith
Affiliation:
North Carolina State University, United States
Wenpei Gao
Affiliation:
North Carolina State University, United States

Abstract

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Type
Diffraction Imaging Across Disciplines
Information
Microscopy and Microanalysis , Volume 27 , Supplement S1 , August 2021 , pp. 1280 - 1281
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Copyright
Copyright © The Author(s), 2021. Published by Cambridge University Press on behalf of the Microscopy Society of America

References

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This work was supported by start-up fund from the College of Engineering and the Department of Materials Science and Engineering at North Carolina State University. Electron microscopy was performed at the Analytical Instrumentation Facility (AIF) at North Carolina State University, which is supported by the State of North Carolina and the National Science Foundation (award number ECCS-2025064). The AIF is a member of the North Carolina Research Triangle Nanotechnology Network (RTNN), a site in the National Nanotechnology Coordinated Infrastructure (NNCI).Google Scholar