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Atomistic Studies of Line Defects at Grain Boundaries

Published online by Cambridge University Press:  03 August 2008

DL Medlin ,
D Cohen ,
RC Pond ,
JC Hamilton  and
O Uche
DL Medlin
Affiliation:
Sandia National Laboratories
D Cohen
Affiliation:
Sandia National Laboratories
RC Pond
Affiliation:
University of Liverpool, United Kingdom
JC Hamilton
Affiliation:
Sandia National Laboratories
O Uche
Affiliation:
Sandia National Laboratories
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Extract

Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Type
Research Article
Information
Microscopy and Microanalysis , Volume 14 , Supplement S2 , August 2008 , pp. 900 - 901
Copyright
© 2008 Microscopy Society of America

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