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Atomic-scale characterization of thermoelectric oxides using high spatial and energy resolution STEM-EELS
Published online by Cambridge University Press: 04 August 2017
Abstract
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- Type
- Abstract
- Information
- Microscopy and Microanalysis , Volume 23 , Supplement S1: Proceedings of Microscopy & Microanalysis 2017 , July 2017 , pp. 370 - 371
- Copyright
- © Microscopy Society of America 2017
References
[1]
Funahashi, R., Barbier, T. & Combe, E.
Journal of Materials Research
30
2015). p. 2544.CrossRefGoogle Scholar
[5] SuperSTEM is the UK's national facility for Aberration Corrected STEM funded by EPSRC.Google Scholar