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Atomic-Resolution Imaging of Graphene Using an Ultrahigh-vacuum Microscope with a High-brightness Electron Gun

Published online by Cambridge University Press:  30 July 2020

Hidetaka Sawada
Affiliation:
JEOL Ltd., Akishima, Tokyo, Japan
Shigeyuki Morishita
Affiliation:
JEOL Ltd., Akishima, Tokyo, Japan
Yuji Kohno
Affiliation:
JEOL Ltd., Akishima, Tokyo, Japan
Takeo Sasaki
Affiliation:
JEOL Ltd., Welwyn Garden City, England, United Kingdom
Masaki Mukai
Affiliation:
JEOL Ltd., Akishima, Tokyo, Japan
Yung-Chang Lin
Affiliation:
AIST, Tsukuba, Ibaraki, Japan
Ryosuke Senga
Affiliation:
AIST, Tsukuba, Ibaraki, Japan
Kazu Suenaga
Affiliation:
AIST, Tsukuba, Ibaraki, Japan
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Abstract

Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
New Frontiers in Electron Microscopy of Two-dimensional Materials
Copyright
Copyright © Microscopy Society of America 2020

References

Suenaga, K. and Koshino, M., Nature 468 (2010) 1088-1090.10.1038/nature09664CrossRefGoogle Scholar
Leuthner, G. T., et al. ., Ultramicroscopy 203 (2019) 76-81.10.1016/j.ultramic.2019.02.002CrossRefGoogle Scholar
Sasaki, T., et al. ., Microsc. Microanal. 23 Suppl 1 (2017) 468-469.10.1017/S1431927617003026CrossRefGoogle Scholar
Sawada, H., et al. ., J. Electron Microsc. 58 (2009) 341-347.10.1093/jmicro/dfp033CrossRefGoogle Scholar
Morishita, S., et al. ., Microscopy 67 (2018) 156-163.10.1093/jmicro/dfy009CrossRefGoogle Scholar
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Atomic-Resolution Imaging of Graphene Using an Ultrahigh-vacuum Microscope with a High-brightness Electron Gun
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