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Atomic-Resolution Composition Mapping in EDS STEM

Published online by Cambridge University Press:  25 July 2016

Nathan R Lugg ,
Akihito Kumamoto ,
Ryo Ishikawa ,
Bin Feng ,
Gerald Kothleitner ,
Naoya Shibata  and
Yuichi Ikuhara
Nathan R Lugg
Affiliation:
Institute of Engineering Innovation, School of Engineering, The University of Tokyo, Tokyo, Japan
Akihito Kumamoto
Affiliation:
Institute of Engineering Innovation, School of Engineering, The University of Tokyo, Tokyo, Japan
Ryo Ishikawa
Affiliation:
Institute of Engineering Innovation, School of Engineering, The University of Tokyo, Tokyo, Japan
Bin Feng
Affiliation:
Institute of Engineering Innovation, School of Engineering, The University of Tokyo, Tokyo, Japan
Gerald Kothleitner
Affiliation:
Institute for Electron Microscopy and Nanoanalysis, Graz University of Technology, Graz, Austria Centre for Electron Microscopy, Graz, Austria
Naoya Shibata
Affiliation:
Institute of Engineering Innovation, School of Engineering, The University of Tokyo, Tokyo, Japan
Yuichi Ikuhara
Affiliation:
Institute of Engineering Innovation, School of Engineering, The University of Tokyo, Tokyo, Japan

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 22 , Supplement S3: Proceedings of Microscopy & Microanalysis 2016 , July 2016 , pp. 1432 - 1433
Copyright
© Microscopy Society of America 2016 

References

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[8] This work is partly supported by: Grant-in-Aid for Scientific Research on Innovative Areas “Nano Informatics” (Grant No. 25106003) from Japan Society for the Promotion of Science (JSPS) and “Nanotechnology Platform” (Project No. 12024046) of the Ministry of Education, Culture, Sports, Science and Technology (MEXT), Japan, Grants-in-Aid for Scientific Research (A) (15H02290) and Grant-in-Aid for Scientific Research (B) (26289234) from the JSPS.Google Scholar