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Atomically Resolved Scanning Confocal Electron Microscopy Using a Double Aberration-corrected Transmission Electron Microscope

  • Peng Wang (a1), Angus I. Kirkland (a2), Peter D. Nellist (a2), Adrian J. D’Alfonso (a3), Andrew J. Morgan (a3), Leslie J. Allen (a3), Ayako Hashimoto (a4) (a5) (a6), Masaki Takeguchi (a4) (a6), Kazutaka Mitsuishi (a4) (a5) (a6) and Masayuki Shimojo (a7)...
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References

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[1] Nellist, P.D.and Wang, P. Annual Review of Materials Research, Annual Reviews 42 2012), p. 125143.
[2] Mitsuishi, K., et al Ultramicroscopy 111 2010) p20-26.
[3] Wang, P., et al Ultramicroscopy 111 2011) p877-886.
[4] Wang, P., et al Physical Review Letters 104 2010) p200801.
[5] Hashimoto, A., et al Appl. Phys. Lett. 101 2012) p253108.
[6] Cosgriff, E.C., et al Ultramicroscopy 108 2008) p1558-1566.
[7] D'Alfonso, A.J., et al Ultramicroscopy 108 2008) p1567-1578.
[8] Wang, P., et al Ultramicroscopy 134 2013) p185-192.
[9] Financial support from the Leverhulme Trust (F/08 749/B), the EPSRC (EP/F048009/1) and the ARC's Discovery Projects funding scheme (DP110102228) is gratefully acknowledged.

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