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Atomically Resolved Scanning Confocal Electron Microscopy Using a Double Aberration-corrected Transmission Electron Microscope

Published online by Cambridge University Press:  27 August 2014

Peng Wang ,
Angus I. Kirkland ,
Peter D. Nellist ,
Adrian J. D’Alfonso ,
Andrew J. Morgan ,
Leslie J. Allen ,
Ayako Hashimoto ,
Masaki Takeguchi ,
Kazutaka Mitsuishi  and
Masayuki Shimojo
Peng Wang
Affiliation:
National Laboratory of Solid State Microstructures and College of Engineering and Applied sciences, Nanjing University, Nanjing 210093, People’s Republic of China
Angus I. Kirkland
Affiliation:
Department of Materials, University of Oxford, Parks Road, Oxford OX1 3PH, UK
Peter D. Nellist
Affiliation:
Department of Materials, University of Oxford, Parks Road, Oxford OX1 3PH, UK
Adrian J. D’Alfonso
Affiliation:
School of Physics, University of Melbourne, Parkville, Victoria 3010, Australia
Andrew J. Morgan
Affiliation:
School of Physics, University of Melbourne, Parkville, Victoria 3010, Australia
Leslie J. Allen
Affiliation:
School of Physics, University of Melbourne, Parkville, Victoria 3010, Australia
Ayako Hashimoto
Affiliation:
Surface Physics and Structure Unit, National Institute for Materials Science, 1-2-1 Sengen, Tsukuba, 305-0047, Japan Global Research Center for Environment and Energy based on Nanomaterials Science, National Institute for Materials Science, 1-2-1 Sengen, Tsukuba, 305-0047, Japan Electron Microscopy Station, National Institute for Materials Science, 1-2-1 Sengen, Tsukuba, 305-0047, Japan
Masaki Takeguchi
Affiliation:
Surface Physics and Structure Unit, National Institute for Materials Science, 1-2-1 Sengen, Tsukuba, 305-0047, Japan Electron Microscopy Station, National Institute for Materials Science, 1-2-1 Sengen, Tsukuba, 305-0047, Japan
Kazutaka Mitsuishi
Affiliation:
Surface Physics and Structure Unit, National Institute for Materials Science, 1-2-1 Sengen, Tsukuba, 305-0047, Japan Global Research Center for Environment and Energy based on Nanomaterials Science, National Institute for Materials Science, 1-2-1 Sengen, Tsukuba, 305-0047, Japan Electron Microscopy Station, National Institute for Materials Science, 1-2-1 Sengen, Tsukuba, 305-0047, Japan
Masayuki Shimojo
Affiliation:
Department of Materials Science and Engineering, Shibaura Institute of Technology, 3-7-5, Toyosu, Koto-ku, Tokyo, 135-8548, Japan

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 20 , Supplement S3: Proceedings of Microscopy & Microanalysis 2014 , August 2014 , pp. 376 - 377
Copyright
Copyright © Microscopy Society of America 2014 

References

[1] Nellist, P.D.and Wang, P. Annual Review of Materials Research, Annual Reviews 42 2012), p. 125143.Google Scholar
[2] Mitsuishi, K., et al Ultramicroscopy 111 2010) p20-26.Google Scholar
[3] Wang, P., et al Ultramicroscopy 111 2011) p877-886.Google Scholar
[4] Wang, P., et al Physical Review Letters 104 2010) p200801.Google Scholar
[5] Hashimoto, A., et al Appl. Phys. Lett. 101 2012) p253108.Google Scholar
[6] Cosgriff, E.C., et al Ultramicroscopy 108 2008) p1558-1566.Google Scholar
[7] D'Alfonso, A.J., et al Ultramicroscopy 108 2008) p1567-1578.Google Scholar
[8] Wang, P., et al Ultramicroscopy 134 2013) p185-192.Google Scholar
[9] Financial support from the Leverhulme Trust (F/08 749/B), the EPSRC (EP/F048009/1) and the ARC's Discovery Projects funding scheme (DP110102228) is gratefully acknowledged.Google Scholar